Acmewin International Corp.

Applications

SEMICONDUCTOR PROCESS APPLICATIONS

Applications

Acmewin Aibo Dry Asher platforms support photoresist strip, de-scum, light plasma treatment, residue-removal and plasma-cleaning applications for semiconductor manufacturing.

Aibo II Dry Asher process platform hero image

Applications Overview

Aibo Dry Asher process applications are reviewed according to wafer size, material stack, residue condition and downstream process requirements.

Post-Poly Etch SEM conventional photoresist strip
Strip

Photoresist Strip

Removes photoresist and organic material after lithography, implantation or etch processing.

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Aibo II HMI process operation interface
De-scum

De-scum

Removes thin resist residue after lithography development and before downstream processing.

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Aibo II HMI close-up process interface
Lite Etch

Lite Etch

Uses controlled plasma exposure for light surface treatment and process development review.

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Aibo II platform system configuration rendering
Plasma Clean

Plasma Clean

Supports organic contamination treatment and selected process residue review.

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Residues After Strip

Anisotropic etching and high-dose ion implantation can form complex compounds that may remain after conventional oxygen-only photoresist ashing.

  • Carbonized photoresist after high-dose implantation
  • Poly-etch sidewall polymer
  • Nitride-etch residue
  • Metal-etch stringers
  • Via-etch cone- or crown-like residue
  • Organic contamination after conventional strip

Application details and process parameters are reviewed according to wafer structure, material stack and project requirements.

Residue-Removal Process Capability

Post-Poly Etch

Post-Poly Etch SEM conventional photoresist strip

Conventional Photoresist Strip

Sidewall polymer residue may remain after conventional photoresist strip.

Post-Poly Etch SEM Aibo residue-removal process

Aibo Residue-Removal Process

Reference SEM image showing improved sidewall polymer removal after an optimized residue-removal process sequence.

Post-Nitride Etch

Post-Nitride Etch SEM residue-removal reference 01

Post-Nitride Etch SEM 01

Post-Nitride Etch SEM residue-removal reference 02

Post-Nitride Etch SEM 02

Post-Nitride Etch Residue-Removal Reference: Reference SEM images illustrating residue-removal process capability following plasma strip and selected post-treatment.

Example flow: O2 Plasma Strip -> Optional Residue-Removal Treatment -> DI Rinse.

Actual chemistry and process settings depend on device structure, material stack and application requirements.

Reference SEM images illustrating residue-removal process capability. Actual results depend on wafer structure, material stack, process sequence and recipe configuration.

Process Challenge to Aibo Approach

High-dose implant carbonized resist

Configurable plasma strip and residue-removal sequence.

Poly-etch sidewall polymer

Multi-step strip and residue-removal capability.

Nitride-etch residue

Plasma strip with optional residue-removal treatment.

Metal-etch stringers and residue

Application-specific plasma and post-treatment review.

Application Advantages

Advantage

Low-Damage Plasma Processing

Plasma architecture designed to minimize electrical charge risk.

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Advantage

Configurable Residue-Removal Sequences

Process steps can be reviewed according to material stack, wafer structure and application requirements.

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Advantage

Multi-Application Platform

Common platform support for strip, de-scum, lite etch and plasma clean.

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Advantage

Process Monitoring

Recipe, trend, alarm and history functions support equipment operation and process review.

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Process Control and Monitoring

Aibo recipe editor public screen
Control

Recipe Management

Recipe workflows support controlled process setup and operating review.

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Aibo data history public screen
Monitoring

Process Trend Monitoring

Trend views support process and equipment status review.

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Aibo II front HMI detail
Diagnostics

Alarm and Event History

Alarm and event information supports troubleshooting and maintenance planning.

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Monitoring

Endpoint Monitoring

Endpoint requirements are reviewed according to process scope and system configuration.

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Aibo interface main public screen
Status

Equipment Status

Equipment status views support operator workflow and service response.

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Application-to-Platform Guide

Aibo I Dry Asher installed system side view
Platform

Aibo I Dry Asher

Compact dry asher and legacy equipment upgrade solution.

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Aibo II Dry Asher main front product image
Platform

Aibo II Dry Asher

4-8 inch multi-application dry asher platform for strip, de-scum, lite etch and plasma clean.

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Aibo III Dry Asher 3D layout rendering front FOUP view
Concept

Aibo III Dry Asher

12-inch conceptual triple process module platform. Conceptual Design / 3D Layout Rendering.

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Related Solutions

Related

Technology

Review plasma, RF, vacuum and automation architecture.

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Related

Acmewin Innovation

Explore RF, pressure-control and wafer-handling innovation summaries.

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Related

Aibo I Upgrade Solution

Review legacy equipment upgrade and HMI modernization paths.

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Related

Aspen2 Services

Review lifecycle support for used equipment, parts, repair and upgrades.

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Discuss Your Dry Asher Application

Provide wafer size, process type, material structure, current equipment and required capacity for application review.